PG Instruments company Limited
|
Place of Origin: | Zhejiang, China (Mainland) |
Add to My Favorites | |
HiSupplier Escrow |
Visible Spectrophotometer T60V, Single Beam Wavelength Range 325 - 1100nm
T60V (Visible) is a split beam system operating within a wavelength range of 190-1100nm. The instrument has a switched model power supply accepting voltages in the range of 95-240V AC and supplied with either universal path length 5 cell changer or fixed path length 8 cell changer as standard. T60V delivers the functionality and accuracy of an advanced instrument at an affordable price.
High quality optical components ensure reliable analytical data with low stray light achieved using very low noise electronic circuits.
Deuterium and tungsten light source deliver superior stability across the full wavelength range. Both types of lamp have self timers and are inexpensive and easy to replace when required.
The monochromator is completely sealed and the optical surfaces can be easily cleaned to maintain optimum reflectivity over the lifetime of the instrument.
A maintenance free high resolution direct stepper drive positions the grating precisely, which ensures reproducible wavelength scanning at different scan speed, thus negating any wavelength peak shift.
The Spectrophotometer shell is made from an environmentally friendly non corrosive material and a simple retaining mechanism on the base allows easy access for air filter changes and routine maintenance.
Features & Functions
Applications:
Education in universities and colleges
Environmental monitoring & control
Food & Beverage production and quality control
Agricultural monitoring
Geology & Metallurgy
Gas & oil
Specifications:
Optical system |
Split beam ratio |
Scan speed |
Selectable |
Wavelength range |
325-1100nm |
Wavelength accuracy |
+2nm |
Wavelength reproducibility |
≤0.4nm |
Spectral bandwidth |
2nm |
Photometric mode |
Transmittance, Absorbance, Energy |
Photometric range |
-0.3-3.0Abs |
Photometric accuracy |
0.002A (0-0.5A), 0.004A (0.5-1A), 0.3%T (0-100%T) |
Photometric reproducibility |
00.001A(0-0.5A), 0.002A(0.5-1A), 0.15%T(0-100%T) |
Photometric noise |
0.001A(500nm) 30min warm-up |
Baseline flatness |
0.002A(325-1000nm) |
Baseline stability |
0.001A/h (500nm, 0Abs), 2hr warm-up |
Stray light |
≤1.0%T(340nm NaNO2) |
Standard functionality |
Photometric & Quantitative Measurement |
Detector |
Silicon photo diode |
Light source |